Reliability Determination of Nanoelectronic Devices Using Semi-Marcov Processes
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Journal of KONBiN
سال: 2020
ISSN: 2083-4608
DOI: 10.2478/jok-2020-0062